High Speed Devices & Circuits Lab

Probe Station:

Cryogenic Probe Station (Lakeshore)

Electrical Probe Station (Suss Micro Tech.)

Temperature Controlled Chuck (Trio Tech., TC1000)

Measurement system:

Load-Pull Measurement System (Focus Microwaves)

Power Device Analyzer/Curve Tracer (Agilent, B1505A)

Power Device Test Fixture (Agilent, N1259A)

Noise Figure Analyzer, 10MHz - 26.5GHz (Agilent, N8975A)

PSA Spectrum Analyzer, 3 Hz - 26.5 GHz (Agilent, E4440A)

Precision Semiconductor Parameter Analyzer (Agilent, 4156C)

Precision LCR Meter, 20 Hz to 1 MHz (Agilent, 4284A)

Network Analyzer Systems, 45 MHz to 110 GHz (Agilent, 8510C)

S-Parameter Test Set, 0.045 to 50 GHz, 2.4 mm (Agilent, 8517B)

Synthesized Swept-Signal Generator, 0.01 - 50 GHz (Agilent, 83650B)

Modular DC Source/Monitor (Agilent, 4142B)

DIVA Dynamic I(V) Analyzer (Accent, D265)

Electrochemical Analyzer (CH Instruments)

Series G 300™ Potentiostat (Gamry Instruments)

Oscilloscope, 200 MHz (Agilent, DSO3202A)

RF power meter (Boonton, 4532)

Others:

Vacuum Oven (Isotemp)

Wire Bonder (West Bond)

Wideband Amplifier (IFI, T18810)

Low-noise current preamplifier (Stanford Research System, SR 570)

60W Power Supply, 60V, 1A  (Agilent, E3617A)