High Speed Devices & Circuits Lab
Probe Station:
Cryogenic Probe Station (Lakeshore)
Electrical Probe Station (Suss Micro Tech.)
Temperature Controlled Chuck (Trio Tech., TC1000)
Measurement system:
Load-Pull Measurement System (Focus Microwaves)
Power Device Analyzer/Curve Tracer (Agilent, B1505A)
Power Device Test Fixture (Agilent, N1259A)
Noise Figure Analyzer, 10MHz - 26.5GHz (Agilent, N8975A)
PSA Spectrum Analyzer, 3 Hz - 26.5 GHz (Agilent, E4440A)
Precision Semiconductor Parameter Analyzer (Agilent, 4156C)
Precision LCR Meter, 20 Hz to 1 MHz (Agilent, 4284A)
Network Analyzer Systems, 45 MHz to 110 GHz (Agilent, 8510C)
S-Parameter Test Set, 0.045 to 50 GHz, 2.4 mm (Agilent, 8517B)
Synthesized Swept-Signal Generator, 0.01 - 50 GHz (Agilent, 83650B)
Modular DC Source/Monitor (Agilent, 4142B)
DIVA Dynamic I(V) Analyzer (Accent, D265)
Electrochemical Analyzer (CH Instruments)
Series G 300™ Potentiostat (Gamry Instruments)
Oscilloscope, 200 MHz (Agilent, DSO3202A)
RF power meter (Boonton, 4532)
Others:
Vacuum Oven (Isotemp)
Wire Bonder (West Bond)
Wideband Amplifier (IFI, T18810)
Low-noise current preamplifier (Stanford Research System, SR 570)
60W Power Supply, 60V, 1A (Agilent, E3617A)